Jerome Kalkhof

Past

• Senior Test Engineer at Busek
• Test Engineer at MicroE Systems
• Senior Test Engineer at DRS - Codem systems

• RF Test Technician at BAE Systems
• Senior Engineer at Raytheon
• Senior Test Engineer at Northrop Grumman

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3 more...

Education

• New York Institute of Technology-Old Westbury

Recommended

1 person has recommended Jerome

Connections

45 connections

Industry

Aviation & Aerospace

Jerome Kalkhof’s Summary

Senior Test Engineer with over 25 years of experience testing both analog and digital circuit assemblies. I design custom interfaces, when necessary, to your current Tester. In major projects, I’ve lead teams of engineers to develop custom functional test solutions to meet Air Force customer requirements.

Jerome Kalkhof’s Experience

• Senior Test Engineer

  Busek

  (Defense & Space industry)

  June 2008 — February 2009 (9 months)

  • Designed new ATE Rack & Stack system to test new product. Did all drawings, wrote test procedures, and had system built. The LabView software was written and I finished the 9 month project in 7½ months.

• Test Engineer

  MicroE Systems

  (Public Company; 11-50 employees; Electrical/Electronic Manufacturing industry)

  July 2006 — May 2007 (11 months)

  Test Fixture Printed Circuit Board design with OrCad, using Surface Mounted Technology.
  Writing test procedures using LABVIEW for new optical encoder product development.
  Designed fixture hardware using AutoCAD 2007 for verification of new components.

• Senior Test Engineer

  DRS - Codem systems

  (Public Company; 11-50 employees; Electrical/Electronic Manufacturing industry)

  November 2005 — May 2006 (7 months)

  System software verification and regression testing to insure product uniformity.
  Embedded Software Testing through Ethernet PCB output.
  Changing Acceptance Test Procedures to improve quality of Ethernet telecommunication products.

• RF Test Technician

  BAE Systems

  (Public Company; 1001-5000 employees; Aviation & Aerospace industry)

  August 2004 — November 2005 (1 year 4 months)

  Troubleshoot, tune, and repair radar R/T assemblies, RF PCB's.
  Re-write test procedures for RF Transmitter and Receiver products for the AN/ALQ-156 Anti-Missile defense system, now being used in Iraq.

• Senior Engineer

  Raytheon

  (Public Company; 5001-10,000 employees; Aviation & Aerospace industry)

  April 1997 — August 2002 (5 years 5 months)

  Created interface adapters to Upgrade Early Warning Radar Up/Down converter hardware modules using VME interface from National Instruments to create automatic parametric and regression testing of radar modules, saving 34 hours of test time per unit.
  Used LABVIEW to control MMIC's (Monolithic Millmetre - wave Integreted Circuits) in UUT to create RF gain profiles (Digital Interface).
  Wrote Performance test specifications and algorithms for testing of RF Hybrid Modules using Visual BASIC 5, as well as designing the interface fixtures through GPIB to HP rack and stack Network Analyzers, and Spectrum Analyzers which enabled automatic factory testing of RF Hybrids, saving an average of 6 hours test time per unit. Modified units to Design for Test (DFT).

• Senior Test Engineer

  Northrop Grumman

  (Public Company; Aviation & Aerospace industry)

  February 1985 — April 1997 (12 years 3 months)

  Designed digital and analog interface circuits between radar boxes and test station. Designed low noise A to D converter for DSP quatuature testing of radar I and Q channel DAC by using a gated Sample & Hold circuit to reduce noise, saving $155,000 in development costs.
  Saved about $50,000 in programming costs by inventing CROSS COMPILER between ASSEMBLY (Embedded 8051 software) programs and ATLAS code. This gave ATLAS the ability to test embedded microprocessor controller (8051) PC Cards using Assembly language programming. This enabled ATE testing of controller PC boards, saving about 16 hours of test time per board.
  Wrote, developed test strategy, and validated programs to test PC Card assemblies on US Navy C.A.S.S. Set up Design For Testing (DFT). ATE using both Teradyne LASAR simulations and Teradyne L200 code in ATLAS. These TPS (Test Program Sets) included cards with ASICs and FPGAs which were modeled in the LASAR digital simulator.

Additional Information

Jerome Kalkhof’s Interests:

Eucharistic Minister and church groups. Mountain Biking. Photography.

Jerome Kalkhof’s Groups:

•    ValleyWorks Professional Networking Group
•    Defense & Aerospace
•    NYIT Alumni

Jerome Kalkhof’s Contact Settings

Interested In:

• career opportunities
• consulting offers
• job inquiries
• expertise requests
• reference requests
• getting back in touch