Aehr Test Systems engages in the design, engineering, and manufacture of test and burn-in products to the semiconductor manufacturing industry. Its systems are designed to reduce the cost of testing flash, dynamic random access memory (DRAM), and other memory devices, as well as to perform reliability screening or burn-in of logic and memory devices. The company’s principal products include MTX massively parallel test system, MAX burn-in systems, FOX full wafer contact system, DiePak carrier, and test fixtures. The MTX system is designed to reduce the cost of memory testing by processing thousands of memory devices simultaneously, including flash memories, DRAMs, and other memories. It is also designed for monitored burn-in of memory and logic devices, such as digital signal processors, microprocessors, microcontrollers, and systems-on-a-chip. The FOX system is a wafer contact parallel test and burn-in system designed to make contact with various pads of a wafer simultaneously, thus enabling full wafer burn-in. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform final test and burn-in of bare die. It also manufactures and sells, and licenses others to manufacture and sell custom-designed test fixtures for its systems. These test fixtures hold the devices undergoing test or burn-in and electrically connect the devices under test to the system electronics. In addition, the company provides customer service and support programs, including system installation, system repair, applications engineering support, spare parts inventories, customer training, and documentation. It markets and sells its products to semiconductor manufacturers, semiconductor contract assemblers, electronics manufacturers, and burn-in and test service companies worldwide. The company was founded in 1977 and is headquartered in Fremont, California.